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- Virginia Panel Corporation
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Tool, Extraction, 50 Ohm Coax & Power Surface
910112112
Tool, Extraction, 50 Ohm Coax & Power Surface
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Profilometer
NANOVEA Optical Profiler is a 3D, non-contact profilometer designed with Chromatic Confocal technology, which uses wavelengths of light to accurately determine physical height. The Optical Profilers NANOVEA offers include compact, stand-alone and portable profilometer models. High-speed sensors are available to scan large surface at high accuracy.
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3D Optical Surface Profiler
NewView™ 9000
The NewView™ 9000 3D optical surface profiler provides powerful versatility in non-contact optical surface profiling. With the system, it is easy and fast to measure a wide range of surface types, including smooth, rough, flat, sloped, and stepped. All measurements are nondestructive, fast, and require no sample preparation.
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Robotic Vehicle Gap / Flush Measurement System
Automation
LaserGauge® Automation is a robotic system for measuring vehicle gap/flush on a moving assembly line. It is cost-effective, fast, flexible, and delivers LaserGauge® accurate measurements. Utilizing the Cross-Vector scanning and Blue Laser Technology, the system provides more assembled-panel surface information than any other robotic laser profiler.
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Non-contact Optical Surface Profiler
VS-OSP
The VersaSCAN OSP integrates the Base with a high-accuracy, high-speed laser displacement sensor. The OSP technique uses diffuse reflection mechanism to measure topography of a sample. OSP can be used to measure topography, as a very sensitive leveling mechanism, or charting topography to be implemented with other scanning probe techniques for constant-distance mode operation.
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3D Optical Profilers
ZYGO's 3D Optical Profiler instruments enable precise, quantitative, ISO-compliant, non-contact surface measurement and characterization of micro- and nano-scale surface features, capturing up to two million data points in just seconds. Applications range from topography and waviness to roughness and microstructure characterization on samples as that vary from ultra-smooth sub-angstrom optical surfaces, to extremely rough and diffuse 3D printed surfaces.
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Surface Analysis
Bruker Nano Surfaces provides industry-leading surface analysis instruments for the research and production environment. Our broad range of 2D and 3D surface profiler solutions supply the specific information needed to answer R&D, QA/QC, and surface measurement questions with speed, accuracy, and ease. Bruker’s AFMs are enabling scientists around the world to make discoveries and advance their understanding of materials and biological systems. Our tribometers and mechanical testers deliver practical data used to help improve development of materials and tribological systems.
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3D Profilers
AEP Technology offers different kinds of 3D profilers. Rugged platform, advanced electronic equipment, clean test space, low carbon emission, low machine noise, high-end lens, etc., make our surface profiler unique in the imaging world. In addition to providing stand-alone contact 3D profilers and optical 3D profilers, we also provide the world's only cross-platform, dual-mode 3D profiler that is compatible with both tactile and optical profilometers.
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Surface Profiler Measurement System
SP series
SP series, high accuracy 3D surface profiler measurement system with white light interferometry.
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Multi-Surface Profiler
Tropel® FlatMaster® MSP
The Tropel® FlatMaster® MSP (Multi-Surface Profiler) is a frequency stepping interferometer that provides fast and accurate metrology for semiconductor wafers up to 300mm in diameter. In seconds up to 3 million data points are collected with sub-micron accuracy enabling total thickness and flatness characterization over the entire surface.
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Surface Profilers
Taylor Hobson offers a world leading range surface form, surface finish and metrology solutions for 3D contour,ideal for the most demanding applications.
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Stylus Profilometry
Dektak®
Bruker's Dektak stylus profilers are the product of over four decades of proprietary technology advances. They provide repeatable, accurate measurements on varied surfaces, from traditional 2D roughness surface characterization and step height measurements to advanced 3D mapping and film stress analyses. Dektak surface profilers have been widely accepted as a superior solution for measuring thin film thickness, stress, and surface roughness and form in applications ranging from educational research verification to semiconductor process control.
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Optical Profilometers
Profilm3D® and Zeta™ optical profilometers provide fast, easy, non-contact solutions for 3D surface topography measurements. Our portfolio of optical profilers supports a variety of measurement techniques, including white light interferometry, True Color imaging and ZDot™ confocal grid structured illumination. KLA Instruments can help guide you to the right optical profiler solution for your unique needs.
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High Resolution Thickness & Surface Profiler for as-sawn Wafers
MX 70x
The MX 70x series measure Thickness, Warp, Waviness, Roughness and are usable for nanotopography.
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Thermal Profiler
V-M.O.L.E.®
The V-M.O.L.E. is a full-featured compact thermal profiler that belies its sophistication in an easy-to-use 3-channel Mini-thermocouple configuration. Ideal for VERIFICATION of PCB profile performance, 3 channels give you Hot, Cold and Sensitive component data for verifying the correct oven settings.
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Premier CTD Profiler
MIDAS CTD
The MIDAS CTD is Valeport's premier CTD Profiler. High accuracy sensors (including ±0.01% pressure) and robust titanium design allow reliable operation to 6000m depth, under the harshest conditions.
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LIXI Profiler
The LIXI Profiler uses our proprietary technology, Radiometric Profiling, the only NDT technology that allows you to see everything you need to manage a healthy pipe system without touching a thing.
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Multi-Parameter Profiler
fastCTDplus Chlorophyll a
An evolution of the miniCTD, the fastCTDplus multi-parameter profiler is designed to deliver the highest quality CTD and Chlorophyll a observations at fast drop rates.
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MiniCTD Profiler
The miniCTD has been developed to provide a cost-effective tool for the collection of CTD Profiles, without compromising the quality of the data.
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Multibeam Profiler Sonar
MB1350-N
At 1.35 MHz, the MB1350 delivers 3D profile data at levels more akin to a laser line scanner than today' low frequency bathymentry systems. Mountable on Boats, ROVs, UUVs, and Tripods, BlueView's MB1350 is the right tool to take your operation into the next generation of 3D bottom and structure mapping.
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Surface Photovoltage
The surface photovoltage spectroscopy modules are the perfect all-in-one solution for in-depth studies of light sensitive materials such as organic semiconductors, solar cells or light sensitive dyes.
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Non-contact 3D Optical Profilers
LuphoScan platforms are interferometric, scanning metrology systems. They are designed to perform ultra precision non-contact 3D form measurements mainly of rotationally symmetric surfaces such as aspheric lenses.
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EV Profiler Kit V2
Harness the power of single-molecule localization microscopy to characterize EVs across scales. Quantify nanometer small, rare, and precious EV samples with super-resolution precision. ONI’s EV Profiler helps you focus on answering the right questions about your EV populations.
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Surface Roughness
Surface Roughness: these consist of a stylus attached to an arm which moves over the surface to record and measure the roughness over a specified distance, recording peak-to-valley average.
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Large Aperture Beam Profilers
Modern laser applications seldom require large beam profiling, combined with high resolution. The BeamOn HR 1" is the perfect solution enabling both relatively large beam characterization, with a high resolution detector of 20 MP. By implementing a diffuser to present the beam to a smaller detector via dedicated optics, one of the largest beam profilers of 60 mm is offered, i.e BeamOn LA U3. Even further than that, for collimated beams the Laser Analyzing Telescope offers an input aperture of 100 mm combined with high resolution, attitude and divergence measurement of the laser beam.
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Surface Contamination Monitor
IMI Inspector Alert™ V2
The IMI Inspector Alert™ V2 measures alpha, beta, gamma and x-radiation using a 2-inch “pancake” GM detector with high sensitivity to common beta and alpha sources. The easy-to-read digital display shows readings in your choice of µSv/hr, mR/hr, CPM, or CPS. The Total/Timer feature allows timed readings from one minute to 40 hours for precise measurement of low level contamination. An audible alert sounds when the radiation reaches a user-adjustable level.
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Surface Profile Gauge
SRT-6223
Specially used to take accurate measurement of the peak to valley height of the surface profile of the surface profile of blast cleaned surfaces.specifications:display: 4 digits. LCDRange: 0um to 800um (0mils to 30mils)Accuracy: +5% or +5( whichever is the greater)resolution: 1um (0.1mils)Metric and Imperial switchablePC interface: RS232CMeasurement speed: >30readings per minuteweight: 280gdimensions: 162x65x28mm(6.4x2.6x1.1 inch)operating temperature: 0-50℃ , 80% RHCase: high impact ABSBatteries: 4x1.5v (AAA) Batterystandard accessories included:carrying case: 1 pcoperation manual 1 pcoptional accessory:cable and software for RS232C
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3D Optical Profiler
7503
Chroma 7503 uses the technology of white light interfaces to measure and analyze the surface profile of micro-nano structures with sophisticated scanning system and innovative algorithms.
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Surface Roughness Tester
A precision instrument used to evaluate the texture of a surface, determining whether it is rough or smooth.
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Optical Profiler
DRK8090
Shandong Drick Instruments Co., Ltd.
This instrument uses noncontact, optical phase shift interferometry method does not damage the surface when measuring graphics can be quickly measured by a variety of three dimensional surface morphology, and analyzed to calculate the measurement results. Suitable for measuring a variety of blocks, the surface roughness of optical components; scale, dial the groove depth; magnetic (optical) disk, the head surface texture measurements; structural morphology of coating thickness and coating trough structure at the boundary of the grating; silicon surface roughness measurement and the graph structure and so on.
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Wind Profilers
Bristol Industrial & Research Associates Ltd
Biral provides Sodar systems for the 3-dimensional measurement of wind speed and direction in a vertical column extending hundreds of metres above the sensor. Sodar systems are used in applications such as wind energy site assessment, wind shear detection at airports, plume modelling and basic research.
