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Broadband Speed Test
Determines the amount of data transferred per second.
- Pickering Interfaces Inc.
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8 Slot, 3U, PXI Chassis - 3 Speed Fan Option
40-908-101
This PXI chassis includes all the features and performance required by version 2.1 of the PXI standard and supports a control interface or embedded controller and up to seven more 3U peripheral modules. Mechanical expansion space on the right hand side allows the chassis to accept multi-slot modules, such as the BRIC, while only occupying one electrical slot.
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USB Power Sensor - 100 MHz To 8 GHz, Average, Peak (Pulse), Pulse Profile
GT-8552B
The Spanawave/Giga-tronics GT-8550B USB Power Sensors offer easy-to-use high-performance RF and microwave power measurement. High dynamic range and high accuracy make these sensors ideal for testing in wireless communication applications and Defense EW systems. The GT-8550B series feature a ruggedized body and fast measurement speed. These broadband power sensors provide easy-to-use, fast, accurate power measurement for R&D laboratory, manufacturing test and field installation and maintenance applications.
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Clock Generation Devices
Analog Devices offers ultralow jitter clock generation products for wireless infrastructure, instrumentation, broadband, automatic test equipment, and other applications demanding subpicosecond performance. Our clock products are ideal for generating the high speed, low noise clock signals required to clock high performance analog-to-digital converters (ADCs) and digital-to-analog converters (DACs). ADI clock ICs integrate PLL cores, dividers, phase offset, skew adjust, and clock drivers in small chip scale packages.
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USB Power Sensor - 100 MHz to 20 GHz, Average, Peak (Pulse), Pulse Profile
GT-8555B
The Spanawave/Giga-tronics GT-8550B USB Power Sensors offer easy-to-use high-performance RF and microwave power measurement. High dynamic range and high accuracy make these sensors ideal for testing in wireless communication applications and Defense EW systems. The GT-8550B series feature a ruggedized body and fast measurement speed. These broadband power sensors provide easy-to-use, fast, accurate power measurement for R&D laboratory, manufacturing test and field installation and maintenance applications.
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USB Power Sensors 10 MHz to 26.5 GHz
GT-8554B
The Spanawave/Giga-tronics GT-8550B USB Power Sensors offer easy-to-use high-performance RF and microwave power measurement. High dynamic range and high accuracy make these sensors ideal for testing in wireless communication applications and Defense EW systems. The GT-8550B series feature a ruggedized body and fast measurement speed. These broadband power sensors provide easy-to-use, fast, accurate power measurement for R&D laboratory, manufacturing test and field installation and maintenance applications.
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USB Power Sensor - 100 MHz to 8 GHz, Average, Peak (Pulse)
GT-8551B
The Spanawave/Giga-tronics GT-8550B USB Power Sensors offer easy-to-use high-performance RF and microwave power measurement. High dynamic range and high accuracy make these sensors ideal for testing in wireless communication applications and Defense EW systems. The GT-8550B series feature a ruggedized body and fast measurement speed. These broadband power sensors provide easy-to-use, fast, accurate power measurement for R&D laboratory, manufacturing test and field installation and maintenance applications.
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USB Power Sensor - 10 MHz to 18 GHz, True-RMS Average
GT-8553B
The Spanawave/Giga-tronics GT-8550B USB Power Sensors offer easy-to-use high-performance RF and microwave power measurement. High dynamic range and high accuracy make these sensors ideal for testing in wireless communication applications and Defense EW systems. The GT-8550B series feature a ruggedized body and fast measurement speed. These broadband power sensors provide easy-to-use, fast, accurate power measurement for R&D laboratory, manufacturing test and field installation and maintenance applications.
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ICE 3000 Series
ICE3009
The ICE3009 subsystem is an agile filter for the VHF-L, VHF-H and UHF frequency bands. It allows operation of a number of transceivers in a cosite environment. The VHF/UHF Filter provides multiple poles of RF selectivity to reduce broadband noise in transmit mode of operation and to reduce interfering signals at the transceiver’s RF input in receive mode at Have Quick II/IIa and SATURN tuning speeds. This design incorporates a flexible control scheme that can be configured at the factory for various radio interfaces (ARC-210, ARC-231, ARINC 429, etc.). The design is highly integrated and includes all filters, amplifiers, power supply, transmit and receive switching (including a bypass mode), and Built-in-Test (BIT). A mounting tray is available as an option for easy incorporation on your platform. This system is qualified for military applications. Cost-effective modifications are available on the ICE3009. Please contact your sales representative at 513.870.9060 or Support@PoleZero.com for details.
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OLED Lifetime Test System
58131
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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PXI Semiconductor/IC Test System
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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VLSI Test Systems
50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
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6TL22 Off-Line Testing Platform
H71002200
Learn about our Build to print service for Test Platforms. The 6TL22 Platform is a perfect base for the conception of a real modular Automatic Test Equipment for low to mid manufacturing volumes.A system designed around the 6TL22 is simple, easy to maintain and cost effective. The rack is prepared for the direct integration of the three platform based receivers from Virginia Panel, the S6, G12 and G12X.
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Sealed Beam Bulb Testing System
H710019SSL
EOL test for manufacturing of bulbs with LED for applications requiring to ensure watertightness: vehicles, marine, swimming pools, operating rooms, classified areas (Ex Zone), etc. The test system checks in a short time all the light and electrical characteristics of the bulb. A high precision Micro Leakage Meter also checks that there are no leaks between the environment and the inside of the bulb. The test results are recorded on the PC and can be printed on a quality control label attached to each unit.
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Fixture Kit 600x455mm RCV 8-slot for 6TL34
AG588
Stopper kit includedYAVCANCON2 for fixture identification not included
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Functional Test Fixtures
Forwessun’s Functional Test Fixtures are tailored to validate the performance of your electronic assemblies, ensuring each product meets critical quality and functional standards. With customisable designs and precision engineering, these fixtures support a range of testing needs—from checking connectivity and function to confirming performance under real-world conditions. Built to handle rigorous demands, Forwessun's solutions are ideal for industries requiring reliable and repeatable results. Whether for high-volume production or specialised testing, our fixtures provide robust, adaptable support to maintain efficiency and accuracy throughout the testing process. We also create, and work with Ingun to create fixtures using the Ingun kit.
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Functional Test Fixtures
Reliable connections to device under test (DUT) test points are essential for robust functional test. Bloomy provides rugged fixtures and cable sets (ITAs) built for thousands and thousands of cycles in manufacturing environments. With the industry’s best mass interconnects and internal electronic keying, our fixtures are easy to change out and are automatically recognized by the test system.
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Fixture Kit In-Line 6TL35 455x600mm
AH500
Fixture Kit for Platforms featuring receiver Virginia Panel 9025 and external pusher system. Its heavy duty design supports more than 3000N.nnThe fixture kit includes the Base fixture (probe plate) as well as the Puhsers plate.
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Universal In-Line Test Platform
UniLine brings 20+ years of test & quality experience to your manufacturing floor and test automation delivers accurate results, without bias. By standardizing test, product quality improves as costs decrease. Equipment becomes understandable and manageable across departments and station support becomes simple.
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BMS Manufacturing Test System
The Battery Management System (BMS) Manufacturing Test System performs functional testing of product during end-of-line manufacturing. The system hardware includes all instrumentation to test a BMS, including multiple cell simulators, a mass interconnect for quick product transition and bed-of-nail fixtures to ensure less down time, higher throughput, and easy maintenance. The system application easily integrates into manufacturing processes, provides a method to test multiple product types, and optimizes tests to ensure only good product is released from manufacturing.
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In-Circuit Test System Repairs
Forwessun provides expert repair services for a wide range of Test Systems, helping you maintain optimal performance and extend the life of your equipment. Our team of skilled technicians quickly identifies and addresses issues, ensuring that your system is back in operation with minimal downtime. We handle both routine and complex repairs, offering comprehensive solutions to keep your systems running efficiently and reliably.
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6TL23 Off-Line Seat Operation Base Test Platform
H71002300
The 6TL23 is a bare rack for creating Off-Line, modular, flexible and reliable Base test platforms. The overall rack capacity is 18U (580mm depth). The rack is ideal for sit-down operation, since there’s space for the operator’s legs under the fixture receiver.
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6TL23 Off-Line seat operation Base Test Platform w/o Table
H71002301
- 18U height 19inch rack space (580mm depth)- VPC G12 or G12X interface- Man Machine interface H73000301 (not included)- stand-up operation
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Military Communications Test
Astronics testers for military radios and wireless communications systems help you keep your most critical communications up and running smoothly. Write test program sets once and deploy them instantaneously everywhere – whether your test set is in the factory, at the depot, or in operation.
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Benchtop Communication Test System
ATS3000A
The ATS3000A is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23 instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The ATS3000A also includes the sophisticated IF and baseband I/Q Digital Signal Processing required for modern radios. The fieldupgradeable, software-defined architecture features easy-touse graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets areavailable for a full range of tactical radios, or you can create new TPSs easily using the included TestEZ® software suite.
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2-Module ICT System, I317x Series 6
E9902G
Keysight's family of i3070 Series 6 In-Circuit Test (ICT) systems are built on a proven technology foundation, and they improve test efficiency with time-tested software, hardware, and programmability. I3070 Series 6 ICT tester supports a wide range of printed circuit board assembly (PCBA) sizes for applications including IoT and 5G, as well as automotive and energy. The i3070 features a unique design that delivers the shortest signal path between measurement circuitry and devices under test to minimize undesired effects from parasitic capacitance, improve immunity to crosstalk, and eliminate stray signal coupling effects, delivering consistent and repeatable measurements. The Series 6 is fully backward compatible with previous systems and makes highly repeatable measurements.
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SHC68-C68-RDIO2, 68-Pin VHDCI Male to 68-Pin VHDCI Male, 80 MHz, Shielded Digital Cable, 2m
156166-02
SHC68-C68-RDIO2 Shielded R Series High Speed Digital Male VHDCI Cable, 2m
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Test Platforms
Leverage 20+ Years of Test Industry Experience with Built-In IP for Maximum Reuse
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In-Line Test Fixture for 6TL33/6TL36
AB799/AT799
Fixture Kit for Platforms featuring receiver Virginia Panel 9025 and external pusher system. Its heavy duty design supports more than 1.000N.nnThe fixture kit includes the Base fixture (probe plate) as well as the Puhsers plate.
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In-Circuit Tester
Sparrow MTS 30
The Sparrow MTS 30 is a 19“ test system that can be integrated into any standard rack. The In-Circuit tester can also be used as benchtop test system. With this compact and flexible tester you can perform both analog and digital In-Circuit and functional tests.
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Functional Test
UTS
The UTS functional test system is perfect for electronics manufacturing operations that have a mix of products where operators load and unload devices under test (DUT) and routinely change out fixtures for each type of DUT.
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PXIe Optical Test Modules
Coherent Solutions’ expanding portfolio of PXIe optical test modules bring a wide range of new mixed-signal test capabilities to the PXI platform. The new modules offer seamless integration with PXI Platform and deliver reliable and repeatable results across a wide range of optical and mixed-signal test applications.
