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- Pickering Interfaces Inc.
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Diagnostic Test Tools For Switching Systems
You know that verification and diagnosis of complex switching operation in a test system has always been an issue. Two of our latest offerings in diagnostic test tools provide a quick and simple way of finding relay failures within LXI, PCI and PXI switch systems.
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Backplane Test System
402LV
Very High Pin Count Level IV Backplane Test System. To ensure that Testronics maintains its leadership position as the premier supplier of backplane testers, we will be introducing our solution to testing high pin count / very large backplanes, the Model 402.
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Tx/Rx SignalBlade
This ATCA compatible test card offers the flexibility to verify the performance of Advanced TCA fabric and base channels. The set of four Transmit pairs and four Receive pairs allows access to a full channel's eight pairs for backplane path characterization. The card includes a HM-ZD connector segment for access to the backplane and edge-launch SMA connectors for ease of test cable attachment. DC blocking capacitors are included on the receive pairs as required by Advanced TCA.
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Test Adapter / Extender
The test adapter is used for measurement and testing of test specimen boards, which gives optimal access of signals, address lines as well as power from backplane assembly.
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Time Domain Reflectometers and S-Parameter Analyzers
The Teledyne LeCroy WavePulser 40iX and the Teledyne Test Tools T3SP15D are a perfect combination of complimentary products to serve the requirements on testing, validating and troubleshooting cables, backplanes, connectors, transmission lines on boards and interconnect.
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PXIe-1071, 4-Slot, Up to 3 GB/s PXI Chassis
781368-01
PXIe, 4-Slot, Up to 3 GB/s PXI Chassis—The PXIe‑1071 is designed for a wide range of test and measurement applications and provides a high-bandwidth backplane. Its compact and lightweight form factor is ideal for minimizing the footprint of your installation, making it ideal for desktop or portable use cases. The PXIe‑1071 accepts PXI Express modules or standard PXI hybrid-compatible modules in every peripheral slot.
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PCI Express, PCI, Multi-Interface Test Backplanes
Amfeltec PCI Express, PCI, Multi-Interface Test Backplanes
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PXIe-1092, 10-Slot (7 Hybrid Slots, 1 PXI Express System Timing Slot, 1 Peripheral Expansion Slot), Up to 24 GB/s PXI Chassis
786991-01
PXIe, 10-Slot (7 Hybrid Slots, 1 PXI Express System Timing Slot, 1 Peripheral Expansion Slot), Up to 24 GB/s PXI Chassis - The PXIe-1092 features a high-bandwidth backplane and up to 82 W of power and cooling in every slot to meet a wide range of high-performance test and measurement application requirements. The all-hybrid backplane enables excellent flexibility for instrumentation module placement by accepting PXI Express modules in every slot and PXI hybrid-compatible modules in up to seven slots. It also offers a Timing and Synchronization option that includes a built-in oven-controlled crystal oscillator (OCXO) for increased clock accuracy and external clock and trigger routing. The chassis includes a peripheral expansion slot in Slot 10 to provide power only for multiple-slot wide modules.
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PCI Express Gen 1 Test Backplane
SKU-015-01
The PCI Express Test Backplane was designed to support production testing/debugging of PCIe-based peripheral boards. The backplane expands the x1 PCI Express interface of the host computer into one x4 and three x1 PCI Express slots via 7 ft CAT6 cable.
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PCI To Star Fabric Module
51-921A-001
The use of the StarFabric interface operating at 2.5Gb/s minimizes the impact on system speed. The PCI interface of the 51-921A supports both 32 bit and 64 bit operation and backplane speeds of 33MHz and 66MHz, ensuring the highest speed operation under all conditions. The StarFabric interface ensures the modules perform seamlessly with no impact on the test system software.
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Test Adapter
cPCI/VME/VME64x
The test adapter is used for measurement and testing of test specimen boards, which gives optimal access of signals, address lines as well as power from backplane assembly. Usually the test adapter includes fields for voltage and amp, current measurements and in some cases also some pins for wire wrap to conduct custom connections.
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PXIe-1082DC, 8-Slot, DC Power Supplies, Up to 8 GB/s PXI Chassis
782946-01
PXIe, 8-Slot, DC Power Supplies, Up to 8 GB/s PXI Chassis—The PXIe‑1082DC features a high-bandwidth backplane to meet a wide range of high-performance test and measurement application needs. It accepts PXI Express modules in every slot and supports standard PXI hybrid-compatible modules in up to four slots. The chassis supports DC inputs from 11 V to 32 V.
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PXIe-1084, 18-Slot (17 Hybrid Slots), Up to 4 GB/s PXI Chassis
784058-01
PXIe, 18-Slot (17 Hybrid Slots), Up to 4 GB/s PXI Chassis—The PXIe-1084 features an all-hybrid backplane to meet a wide range of high-performance test and measurement application needs. The hybrid connector type in every peripheral slot enables the most flexibility in terms of instrumentation module placement.
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PXI Power Supply Modules
Fixed power supply modules provide you with up to four separate voltage outputs isolated from the PXI backplane. Any combination of 3.3V, 5V, 12V or 15V can be specified with a maximum current capability of 4A for the 3.3V option; the software provides on/off control and status monitoring for each output. Dual programmable power supplies are capable of supplying up to 60 Watts of power. These are ideal solution for applications where a self contained test system with a high power supply power capability is required in a PXI format.
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PXIe-1084, 18-Slot (17 Hybrid Slots), Up to 4 GB/s PXI Chassis
786397-01
PXIe, 18-Slot (17 Hybrid Slots), Up to 4 GB/s PXI Chassis - The PXIe-1084 features an all-hybrid backplane to meet a wide range of high-performance test and measurement application needs. It also offers a Timing and Synchronization option that includes external clock and trigger routing. The hybrid connector type in every peripheral slot enables the most flexibility in terms of instrumentation module placement.
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Electrical Receiver Conformance Test Application for IEEE 802.3bs/cd
M8091BSCB
IEEE 802.3bs receiver test application for 200GAUI-4 and 400GAUI-8, covering chip-to-module, chip-to-chip, backplane, and copper cable interconnects.
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PXIe-1085, 18-Slot (16 Hybrid Slots, 1 PXIe Timing Slot), Up to 24 GB/s PXI Chassis
781813-01
PXIe, 18-Slot (16 Hybrid Slots, 1 PXIe Timing Slot), Up to 24 GB/s PXI Chassis—The PXIe‑1085 features a high-bandwidth, all-hybrid backplane to meet a wide range of high-performance test and measurement application needs. The hybrid connector type in every peripheral slot enables the most flexibility in terms of instrumentation module placement.
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PCIe 5.0 Test Platform
PXP-500A
The Teledyne LeCroy PXP-500A Test Platform provides a convenient means for testing PCIe 5.0 cards with a self-contained portable and powered passive backplane. The PXP-500A provides power required for both cards under test.
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Adapter PCIe straddle mount to 3U VPX
This adapter connects to the 3U VPX extender to test a PCIe card in a VPX environment. The internal PCB routing is dependent on the VPX profile used in the VPX chassis backplane. Customer must specify the profile used or supply a pin out profile for the slot in question.
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PCIe 4.0 Test Platform
PXP-400A
The Teledyne LeCroy PXP-400A Test Platform provides a convenient means for testing PCIe 4.0 cards with a self-contained portable and powered passive backplane. The PXP-400A provides power required for both cards under test, and an interposer can be used for connection to a protocol analyzer.
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Pulse Pattern Generator, 3.35 GHz, single channel
81133A
The Keysight 81133A single-channel 3.35 GHz Pulse Pattern Generator is the latest product in the long history of Keysights high-speed Pulse Pattern Generators. When timing and performance requirements are critical, for example in high-speed serial bus applications like PCI Express or Serial ATA, its fast rise times and low intrinsic jitter allow the precise and in-depth characterization of devices, e.g. receivers or backplanes. Like its predecessor, the Keysight 8133A, the new 81133A sets the standard for high-speed applications. The Keysight 81133A lets you test your DUT instead of the pulse or data source! For applications that require multiple output channels or multi-level signaling like pre- and de-emphasis (PCI Express) or squelch (Serial ATA), please refer to the 81134A.
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Signal Generator Adapter Module For FlexRIO
Signal Generator Adapter Modules for FlexRIO feature either high or low‐speed analog output and can be paired with a PXI FPGA Module for FlexRIO or the Controller for FlexRIO for custom signal generation. Whether you need to dynamically generate waveforms on the FPGA or stream them across the PXI backplane, these adapter modules are well suited for applications in communications, hardware‐in‐the‐loop (HIL) test, and scientific instrumentation.
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PCIe 6.0 Protocol Test Backplane
P5563B
The Keysight P5563B PCIe 6.0 Protocol Test Backplane provides a convenient means for testing PCIe 6.0 add-in cards with a self-contained portable and powered passive backplane. The P5563B provides power required for all combination of exerciser and analyzer with device under test.
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Receiver Conformance Test Application for IEEE 802.3bm
M8091BMCA
IEEE 802.3bm Receiver Test Application for 25GAUI-1 Chip-to-Module, Chip-to-Chip, Cable and Backplane.
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CPCI
Modules in compact PCI from Data Patterns are available for Data Acquisition and Control, Simulation, Communication Automatic test equipment, Rugged systems, Fail-safe systems, Computer controlled logic controls, Plant automation and similar requirements. Other I/O functions available from our IP and Mezzanine Module families can be directly integrated into our cPCI systems.Data Patterns has also pioneered cPCI derivatives such as 9U High Voltage systems, Multiple backplane support with Hot Standby Switchover capabilities. Continuous innovation enables MMI options such as CRT & LCD displays, Keyboards, Pointing devices, Finger print security devices and so on.
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21 Slot, 3U PXIe Chassis
GX7200 Series
The GX7200 Series mainframes are 21-slot PXI chassis that can accommodate up to 20 instruments as well as a PXI Express controller (an embedded CPU or a PXI bus expander interface such as the MXI). The backplane architecture supports Gen 2 PCI Express bus signaling and the use of both x1 or x4 system controllers. By offering a combination of PXI-1, Hybrid, and Express slots, the GX7200 offers users the ultimate in flexibility for general purpose as well as high bandwidth test needs.
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Open Test Platform for High Performance Automotive Applications
TSVP
The R&S®TSVP family of products is an open test platform from Rohde & Schwarz ideal for high performance automated test equipment (ATE) applications. The chassis contains a mechanical frame, digital backplane, analog backplane, mains switching and filtering, power supply and diagnostic extensions. A highlight is the analog bus for routing measurement signals between different slots without additional external wiring.
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Backplane & Cable Test
Backplane and cable test systems from Terotest include LINX, a fixtureless test system. Each LINX test card plugs directly into the unit under test, which removes the necessity for long test cables and fixtures. This is called distributed testing and results in dramatically lowered costs. LINX is extremely easy to use, with a self-learn function or input from CAD.
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PLTS Measurement And Calibration
N19303B
The new Physical Layer Test System (PLTS) 2024 is the industry standard for signal integrity measurements and data post‑processing high-speed interconnects, such as cables, backplanes, PCBs, and connectors. Signal integrity laboratories worldwide have benefited from the power of PLTS in the R&D prototype test phase.
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Digital Interconnect Test System, Reference Solution
When you need to measure advanced S-parameters with a fast, low-cost and easy-to-use test solution, the Digital Interconnect Test System gives you a significant edge. It provides a full 32-port vector network analyzer (VNA) configured within a single PXI chassis – ideal for high-speed cable testing. And lets you test any linear passive interconnect faster and easier, including backplanes, connectors and PCBs. Sharpen your edge with Keysight’s Digital Interconnect Test System that enables signal integrity characterization of multiport interconnect products.
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PXIe-1085, 18-Slot (16 Hybrid Slots, 1 PXIe Timing Slot), Up to 24 GB/s PXI Chassis
783588-01
PXIe, 18-Slot (16 Hybrid Slots, 1 PXIe Timing Slot), Up to 24 GB/s PXI Chassis—The PXIe‑1085 features a high-bandwidth, all-hybrid backplane to meet a wide range of high-performance test and measurement application needs. The hybrid connector type in every peripheral slot enables the most flexibility in terms of instrumentation module placement.
