Rigaku Corp.
Since its inception in 1951, Rigaku has been at the forefront of analytical and industrial instrumentation technology. Today, with hundreds of major innovations to their credit, the Rigaku group of companies are world leaders in the fields of general X-ray diffraction, thin film analysis, X-ray fluorescence spectrometry, small angle X-ray scattering, protein and small molecule X-ray crystallography, Raman spectroscopy, X-ray optics, semiconductor metrology, X-ray sources, computed tomography, nondestructive testing and thermal analysis.
- +81 3-3479-0618
- +81 3-3479-6171
- info-gsm@rigaku.co.jp
- 3-9-12, Matsubara-cho
Akishima-shi, Tokyo
Tokyo, 196-8666
Japan
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product
Benchtop X-ray diffraction (XRD) instrument
MiniFlex
New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is widely used in research, especially in material science and chemistry, as well as in industry for research and quality control. It is the newest addition to MiniFlex series of benchtop X-ray diffraction analyzers from Rigaku, which began with the introduction of the original MiniFlex system decades ago.
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Multipurpose X-Ray Diffractometer with Built-In Intelligent Guidance
SmartLab SE
The SmartLab® SE is a highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance. It offers continued refinement of the original ease of use features that enabled the original SmartLab to receive the R&D 100 Award in 2006: automatic alignment, component recognition, cross beam optics and advanced photon counting hybrid pixel array detectors (HPAD).
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Labratory Micro-Spot XRD Residual Stress Analysus with both Iso- and Side-Inclination Methods
AutoMATE II
Residual stress may be created during the manufacturing process of a material, or it may accumulate in a structure over many years in operation. In either case, this stress can have a serious negative effect on a product's quality, durability and lifetime. Accurate detection of residual stress is an important element of the quality control process and helps predict the service lifetime of products.
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Small-Angle X-Ray Scattering (SAXS) Products
Small-Angle X-Ray Scattering (SAXS) Products from Rigaku
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X-Ray Seamless Pixel Array Detector
XSPA-400 ER
In general, X-ray diffraction measurements using a Cu X-ray source are known to have difficulty detecting trace crystalline phases because of increased background when measuring samples containing transition metals. The high energy resolution of the XSPA-400 ER supresses the fluorescent X-rays originating from the sample, thereby reducing background, enabling highly sensitive measurements of samples containing transition metals, such as iron and steel compounds and battery materials.Therefore, it achieves higher sensitivity measurements than conventional detectors.
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Process XRR, XRF, and XRD metrology FAB tool
MFM310
Thickness, density, roughness & composition of films on blanket and patterned wafers. The Rigaku MFM310 performs high-precision measurements not possible by optical or ultrasonic techniques. This sophisticated X-ray metrology tool makes it practical to perform high-throughput measurements on product and blanket wafers ranging from ultrathin single-layer films to multilayer stacks.
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X-ray Diffraction (XRD) Instruments
X-ray diffraction (XRD) is one of the most important non-destructive tools to analyze all kinds of matter—ranging from fluids, to powders and crystals. From research to production and engineering, XRD is an indispensable method for materials characterization and quality control. Rigaku has developed a range of diffractometers, in co-operation with academic and industrial users, which provide the most technically advanced, versatile and cost-effective diffraction solutions available today.
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Tube-Above Wavelength Dispersive X-ray Fluorescence Spectrometer
ZSX Primus IV
As a tube-above sequential wavelength dispersive X-ray fluorescence spectrometer, the new Rigaku ZSX Primus IV delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in a wide variety of sample types — with minimal standards. ZSX Guidance supports you in all aspects of measurement and data analysis. Can accurate analysis only be performed by experts ? No — that is in the past. ZSX Guidance software, with the built-in XRF expertise and know-how of skilled experts, takes care of sophisticated settings. Operators simply input basic information about samples, analysis components and standard composition. Measured lines with the least overlap, optimum backgrounds and correction parameters (including line overlaps) are automatically set with aid of qualitative spectra.
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Total Reflection X-Ray Fluorescence (TXRF) Products
Total Reflection X-Ray Fluorescence (TXRF) Products by Rigaku
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Simultaneous Wavelength Dispersive X-ray Fluorescence Spectrometer
Simultix 15
Multi-channel simultaneous wavelength dispersive X-ray fluorescence (WDXRF) spectrometer system, the Simultix 15 high-throughput WDXRF spectrometer. Analyze beryllium (Be) through uranium (U) in almost any sample matrix. The most important metrics for automated process control are precision, accuracy and sample throughput. With up to 30 (and optionally 40) discrete and optimized elemental channels and 4 kW (or optionally 3 kW) of X-ray tube power, Simultix 15 delivers unparalleled analytical speed and sensitivity.
